
Information
- Designation : Assistant Professor
- Email : dipjyoti@ece.nits.ac.in
- Phone : 9864865210
Key Notes
- Conference: International - 12
- Journals: 37
- Conferences: 12
- Book Chapter: 1
- Patents: 2
- Post Graduates: Guided: 4
50
PUBLICATIONS2
PATENTSIntroduction [Biosketch]
- Dr. Dipjyoti Das is an accomplished academician and researcher specializing in semiconductor devices, microelectronics, and ferroelectric materials. He holds a Ph.D. from the Indian Institute of Technology (IIT) Guwahati and has enriched his expertise through postdoctoral research at globally renowned institutions, including the Georgia Institute of Technology (USA) and the Korea Advanced Institute of Science and Technology (KAIST, South Korea). Currently, he serves as an Assistant Professor at NIT Silchar.
- His work has been published in top-tier journals such as IEEE Electron Device Letters, IEEE Transactions on Electron Devices, and ACS Applied Materials & Interfaces, with over 1,200 citations (h-index: 20). His publications include 37 peer-reviewed journal articles, 11 conference papers, and a book chapter.
Areas of Interest
- Ferroelectronics, Semiconductor Devices, Nanoelectronics, Organic Optoelectronic Devices, Non-volatile Memory
Institution | Year | Degree |
---|---|---|
Indian Institute of Technology, Guwahati | 2018 | PhD |
Assam Engineering College | 2011 | Bachelor of Engineering |
Teaching Experience
National Institute of Technology, Silchar
Industrial/Research Experience
Georgia Institute of Technology, Atlanta, USA
Korea Advanced Institute of Science and Technology, South Korea
C. Park, P. V. Ravindran, D. Das, P. G. Ravikumar, C. Zhang, N. Afroze, L. Fernandes, Y. H. Kuo, J. Hur, H. Chen, M. Tian, W. Chern, S. Yu, A. I. Khan, “Plasma-Enhanced Atomic Layer Deposition-Based Ferroelectric Field-Effect Transistors”, IEEE Journal of the Electron Devices Society, Volume 12, 569-572, 2024, Indexed in SCIE, Impact Factor: 2, Quartile: Q2
M. Passlack, N. Tasneem, C. Park, P. Ravindran, H. Chen, D. Das, S. Yu, E.Chen, J.-F Wang, C-S. Chang, Y-M. Lin, I. Radu, A. Khan, “The origin of memory window closure with bipolar stress cycling in silicon ferroelectric field-effect-transistors”, JOURNAL OF APPLIED PHYSICS, Volume 135, Issue 13, 2024, Indexed in SCIE, Impact Factor: 2.7, Quartile: Q2
Rajib Sutradhar, Chinmaya Kumar Pradhan, Himangshu Jyoti Gogoi, Pukhrambam Puspa Devi, Kuldeep Gogoi, Dipjyoti Das, “Material Characterization and Resistive Switching Properties of Lead-Free Cs2CuBiCl6 for Memory Applications”, In Proceedings 5th International Conference on Micro and Nanoelectronics Devices, Circuits and Systems, 2025, January 31st 2025, 2025, National Institute of Technology Silchar, India, Springer, Indexed in Scopus, Ranking Best Paper Award
Sl.No | Course Name | Semester | Course Code | Duration | Status |
---|---|---|---|---|---|
1 | Power Electronics | B.Tech | EC 310 | ||
2 | Electrical and Electronics Materials | B.Tech | EC 208 | ||
3 | Selected Topic on VLSI | B.Tech | EC 485 | ||
4 | Basic Electronics | B.Tech | EC 101 |
ReRAM, Double Perovskite
Rajib Sutradhar
Enrolled: 25 August 2023
Ongoing
Supervisor : Pukhrambam Puspa Devi
Co Supervisor : Dipjyoti Das
Novel Gate Stack Design for Fe-NAND
Abhiyant Singh
Enrolled: 6 August 2024
Ongoing
Supervisor : Dipjyoti Das
Charge Trapping Effects, Ferroelectric Memories
Aman Kumar
Enrolled: 22 August 2024
Ongoing
Supervisor : Dipjyoti Das
Kottana Jagadeesh
Enrolled: 12 August 2024
Ongoing
Supervisor : Srimanta Baishya
Co Supervisor : Dipjyoti Das
Awards And Honours
- 2024 Haedong best paper award (academic category) 2024
- BK21+ Fellowship, South Korea. 2019 – 2020
- Senior Research Fellow, MHRD, Govt, of India. 2014 – 2017
- Junior Research Fellow, MHRD, Govt, of India. 2012 – 2014
- Certificate of Proficiency, Assam Higher Secondary Education Council, Assam. 2007
- Anundoram Borooah Award 2005, Govt. of Assam. 2005
FERROELECTRIC GATE STACK WITH TUNNEL DIELECTRIC INSERT FOR NAND APPLICATIONS
“A SYSTEM FOR STUDYING AND PERFORMING THE PART-OF-SPEECH TAGGING FOR MIZO LANGUAGE”
USA
Patent
Registration ID, 63/606,684
FERROELECTRIC GATE STACK WITH TUNNEL DIELECTRIC INSERT FOR NAND APPLICATIONS, (**GRANTED**)
DISTURB MITIGATION SCHEME FOR FERROELECTRIC FIELD-EFFECT TRANSISTORS
“A SYSTEM FOR STUDYING AND PERFORMING THE PART-OF-SPEECH TAGGING FOR MIZO LANGUAGE”
USA
Patent
Registration ID, 63/692,275
DISTURB MITIGATION SCHEME FOR FERROELECTRIC FIELD-EFFECT TRANSISTORS, (**GRANTED**)
Sl.No | Award/Recognition/Achievement | Year | Approved agency |
---|---|---|---|
1 | Haedong Best Paper Award (Academic Category) | 2024 | The Institute of Electronics and Information Engineers |