Dr.Dipjyoti Das

Information

  • Designation : Assistant Professor
  • Email : dipjyoti@ece.nits.ac.in
  • Phone : 9864865210

Key Notes

  • Conference: International - 12
  • Journals: 37
  • Conferences: 12
  • Book Chapter: 1
  • Patents: 2
  • Post Graduates: Guided: 4

50

PUBLICATIONS

2

PATENTS

Introduction [Biosketch]

  • Dr. Dipjyoti Das is an accomplished academician and researcher specializing in semiconductor devices, microelectronics, and ferroelectric materials. He holds a Ph.D. from the Indian Institute of Technology (IIT) Guwahati and has enriched his expertise through postdoctoral research at globally renowned institutions, including the Georgia Institute of Technology (USA) and the Korea Advanced Institute of Science and Technology (KAIST, South Korea). Currently, he serves as an Assistant Professor at NIT Silchar.
  • His work has been published in top-tier journals such as IEEE Electron Device Letters, IEEE Transactions on Electron Devices, and ACS Applied Materials & Interfaces, with over 1,200 citations (h-index: 20). His publications include 37 peer-reviewed journal articles, 11 conference papers, and a book chapter.

Areas of Interest

  • Ferroelectronics, Semiconductor Devices, Nanoelectronics, Organic Optoelectronic Devices, Non-volatile Memory

Institution Year Degree
Indian Institute of Technology, Guwahati 2018 PhD
Assam Engineering College 2011 Bachelor of Engineering

Teaching Experience
Assistant Professor
28 December 2023 - Present
National Institute of Technology, Silchar

Industrial/Research Experience
Postdoctoral Fellow / Electrical and Computer Engineering
Georgia Institute of Technology, Atlanta, USA

Post-doctoral Researcher / Electrical Engineering
Korea Advanced Institute of Science and Technology, South Korea

C. Park, P. V. Ravindran, D. Das, P. G. Ravikumar, C. Zhang, N. Afroze, L. Fernandes, Y. H. Kuo, J. Hur, H. Chen, M. Tian, W. Chern, S. Yu, A. I. Khan, “Plasma-Enhanced Atomic Layer Deposition-Based Ferroelectric Field-Effect Transistors”, IEEE Journal of the Electron Devices Society, Volume 12, 569-572, 2024, Indexed in SCIE, Impact Factor: 2, Quartile: Q2

M. Passlack, N. Tasneem, C. Park, P. Ravindran, H. Chen, D. Das, S. Yu, E.Chen, J.-F Wang, C-S. Chang, Y-M. Lin, I. Radu, A. Khan, “The origin of memory window closure with bipolar stress cycling in silicon ferroelectric field-effect-transistors”, JOURNAL OF APPLIED PHYSICS, Volume 135, Issue 13, 2024, Indexed in SCIE, Impact Factor: 2.7, Quartile: Q2

Rajib Sutradhar, Chinmaya Kumar Pradhan, Himangshu Jyoti Gogoi, Pukhrambam Puspa Devi, Kuldeep Gogoi, Dipjyoti Das, “Material Characterization and Resistive Switching Properties of Lead-Free Cs2CuBiCl6 for Memory Applications”, In Proceedings 5th International Conference on Micro and Nanoelectronics Devices, Circuits and Systems, 2025, January 31st 2025, 2025, National Institute of Technology Silchar, India, Springer, Indexed in Scopus, Ranking Best Paper Award

Sl.No Course Name Semester Course Code Duration Status
1 Power Electronics B.Tech EC 310
2 Electrical and Electronics Materials B.Tech EC 208
3 Selected Topic on VLSI B.Tech EC 485
4 Basic Electronics B.Tech EC 101

ReRAM, Double Perovskite

Rajib Sutradhar
Enrolled: 25 August 2023
Ongoing
Supervisor : Pukhrambam Puspa Devi
Co Supervisor : Dipjyoti Das

Novel Gate Stack Design for Fe-NAND

Abhiyant Singh
Enrolled: 6 August 2024
Ongoing
Supervisor : Dipjyoti Das

Charge Trapping Effects, Ferroelectric Memories

Aman Kumar
Enrolled: 22 August 2024
Ongoing
Supervisor : Dipjyoti Das

Kottana Jagadeesh
Enrolled: 12 August 2024
Ongoing
Supervisor : Srimanta Baishya
Co Supervisor : Dipjyoti Das

Awards And Honours

    • 2024 Haedong best paper award (academic category) 2024
    • BK21+ Fellowship, South Korea. 2019 – 2020
    • Senior Research Fellow, MHRD, Govt, of India. 2014 – 2017
    • Junior Research Fellow, MHRD, Govt, of India. 2012 – 2014
    • Certificate of Proficiency, Assam Higher Secondary Education Council, Assam. 2007
    • Anundoram Borooah Award 2005, Govt. of Assam. 2005

FERROELECTRIC GATE STACK WITH TUNNEL DIELECTRIC INSERT FOR NAND APPLICATIONS

“A SYSTEM FOR STUDYING AND PERFORMING THE PART-OF-SPEECH TAGGING FOR MIZO LANGUAGE”

USA
Patent Registration ID, 63/606,684
FERROELECTRIC GATE STACK WITH TUNNEL DIELECTRIC INSERT FOR NAND APPLICATIONS, (**GRANTED**)

DISTURB MITIGATION SCHEME FOR FERROELECTRIC FIELD-EFFECT TRANSISTORS

“A SYSTEM FOR STUDYING AND PERFORMING THE PART-OF-SPEECH TAGGING FOR MIZO LANGUAGE”

USA
Patent Registration ID, 63/692,275
DISTURB MITIGATION SCHEME FOR FERROELECTRIC FIELD-EFFECT TRANSISTORS, (**GRANTED**)

Sl.No Award/Recognition/Achievement Year Approved agency
1 Haedong Best Paper Award (Academic Category) 2024 The Institute of Electronics and Information Engineers
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